Some of the approaches used are, for example, measurements by means of scanning electron microscopy, ex situ and in situ X-ray powder diffractometry XRD, in situ raman and infrared spectroscopy, or in ...
and X-ray diffractometry. Both compounds are layer silicates with basal spacings of 11.10 and 7.38 Å, respectively. In both forms the ratio of Q4 silicon (connected via oxygen bridges with four ...